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https://doi.org/https://doi.org/10.1016/j.jengtecman.2026.101946
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@article{xue2026,
title = {{The bright side of dark traits: CEO narcissism and corporate innovation excellence}},
author = {Xue Lei et al.},
journal = {Journal of Engineering and Technology Management},
year = {2026},
doi = {https://doi.org/https://doi.org/10.1016/j.jengtecman.2026.101946},
}TY - JOUR
TI - The bright side of dark traits: CEO narcissism and corporate innovation excellence
AU - al., Xue Lei et
JO - Journal of Engineering and Technology Management
PY - 2026
ER -
Xue Lei et al. (2026). The bright side of dark traits: CEO narcissism and corporate innovation excellence. *Journal of Engineering and Technology Management*. https://doi.org/https://doi.org/10.1016/j.jengtecman.2026.101946
Xue Lei et al.. "The bright side of dark traits: CEO narcissism and corporate innovation excellence." *Journal of Engineering and Technology Management* (2026). https://doi.org/https://doi.org/10.1016/j.jengtecman.2026.101946.
The bright side of dark traits: CEO narcissism and corporate innovation excellence
Xue Lei et al. · Journal of Engineering and Technology Management · 2026
https://doi.org/https://doi.org/10.1016/j.jengtecman.2026.101946
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