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DS-IIEG: a dual-stage industrial image enhancement and generation framework for robust surface defect detection in manufacturing with limited data

Xiaoqiao Wang et al.

Journal of Intelligent Manufacturing2026https://doi.org/10.1007/s10845-025-02774-3article
AJG 1ABDC B
Weight
0.37

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https://doi.org/https://doi.org/10.1007/s10845-025-02774-3

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@article{xiaoqiao2026,
  title        = {{DS-IIEG: a dual-stage industrial image enhancement and generation framework for robust surface defect detection in manufacturing with limited data}},
  author       = {Xiaoqiao Wang et al.},
  journal      = {Journal of Intelligent Manufacturing},
  year         = {2026},
  doi          = {https://doi.org/https://doi.org/10.1007/s10845-025-02774-3},
}

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DS-IIEG: a dual-stage industrial image enhancement and generation framework for robust surface defect detection in manufacturing with limited data

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Evidence weight

0.37

Balanced mode · F 0.40 / M 0.15 / V 0.05 / R 0.40

F · citation impact0.16 × 0.4 = 0.06
M · momentum0.53 × 0.15 = 0.08
V · venue signal0.50 × 0.05 = 0.03
R · text relevance †0.50 × 0.4 = 0.20

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