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https://doi.org/https://doi.org/10.1016/j.compind.2026.104464
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@article{x.2026,
title = {{LightDefectNet: A lightweight end-to-end model for multiscale defects and complex backgrounds in cold-rolled steel}},
author = {X. J. Wang et al.},
journal = {Computers in Industry},
year = {2026},
doi = {https://doi.org/https://doi.org/10.1016/j.compind.2026.104464},
}TY - JOUR
TI - LightDefectNet: A lightweight end-to-end model for multiscale defects and complex backgrounds in cold-rolled steel
AU - al., X. J. Wang et
JO - Computers in Industry
PY - 2026
ER -
X. J. Wang et al. (2026). LightDefectNet: A lightweight end-to-end model for multiscale defects and complex backgrounds in cold-rolled steel. *Computers in Industry*. https://doi.org/https://doi.org/10.1016/j.compind.2026.104464
X. J. Wang et al.. "LightDefectNet: A lightweight end-to-end model for multiscale defects and complex backgrounds in cold-rolled steel." *Computers in Industry* (2026). https://doi.org/https://doi.org/10.1016/j.compind.2026.104464.
LightDefectNet: A lightweight end-to-end model for multiscale defects and complex backgrounds in cold-rolled steel
X. J. Wang et al. · Computers in Industry · 2026
https://doi.org/https://doi.org/10.1016/j.compind.2026.104464
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