Cite this paper
https://doi.org/https://doi.org/10.1016/j.ijinfomgt.2026.103046
Or copy a formatted citation
@article{chun2026,
title = {{Cognitive technostress appraisal: Conceptualization and measurement development}},
author = {Chun Lei & Eric W.T. Ngai},
journal = {International Journal of Information Management},
year = {2026},
doi = {https://doi.org/https://doi.org/10.1016/j.ijinfomgt.2026.103046},
}TY - JOUR
TI - Cognitive technostress appraisal: Conceptualization and measurement development
AU - Lei, Chun
AU - Ngai, Eric W.T.
JO - International Journal of Information Management
PY - 2026
ER -
Chun Lei & Eric W.T. Ngai (2026). Cognitive technostress appraisal: Conceptualization and measurement development. *International Journal of Information Management*. https://doi.org/https://doi.org/10.1016/j.ijinfomgt.2026.103046
Chun Lei & Eric W.T. Ngai. "Cognitive technostress appraisal: Conceptualization and measurement development." *International Journal of Information Management* (2026). https://doi.org/https://doi.org/10.1016/j.ijinfomgt.2026.103046.
Cognitive technostress appraisal: Conceptualization and measurement development
Chun Lei & Eric W.T. Ngai · International Journal of Information Management · 2026
https://doi.org/https://doi.org/10.1016/j.ijinfomgt.2026.103046
Paste directly into BibTeX, Zotero, or your reference manager.