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https://doi.org/https://doi.org/10.1504/ijmtm.2026.151522
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@article{liwei2026,
title = {{Product design sketch defect detection method based on feature extraction}},
author = {Liwei Sun},
journal = {International Journal of Manufacturing Technology and Management},
year = {2026},
doi = {https://doi.org/https://doi.org/10.1504/ijmtm.2026.151522},
}TY - JOUR
TI - Product design sketch defect detection method based on feature extraction
AU - Sun, Liwei
JO - International Journal of Manufacturing Technology and Management
PY - 2026
ER -
Liwei Sun (2026). Product design sketch defect detection method based on feature extraction. *International Journal of Manufacturing Technology and Management*. https://doi.org/https://doi.org/10.1504/ijmtm.2026.151522
Liwei Sun. "Product design sketch defect detection method based on feature extraction." *International Journal of Manufacturing Technology and Management* (2026). https://doi.org/https://doi.org/10.1504/ijmtm.2026.151522.
Product design sketch defect detection method based on feature extraction
Liwei Sun · International Journal of Manufacturing Technology and Management · 2026
https://doi.org/https://doi.org/10.1504/ijmtm.2026.151522
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